Systematics of Structural, Phase Stability, and Cohesive Properties of η′-Cu6(Sn,In)5 Compounds Occurring in In-Sn/Cu Solder Joints

DELUQUE TORO, C. E.; FERNÁNDEZ GUILLERMET, A.; GONZÁLEZ LEMUS, N. V.; CABEZA, G. F.; RAMOS, S. B.

JOURNAL OF ELECTRONIC MATERIALS

SPRINGER

Lugar: Berlin; Año: 2017 vol. 46 p. 4485 - 4496

0361-5235

Motivated by the high solubility of In in (mC44) η′-Cu6Sn5 compound as well as the occurrence of an In-doped η′-intermetallic in the microstructure of Cu/In-Sn/Cu solder joints, a theoretical study has been carried out to investigate the various physical effects of incorporating In at Sn Wyckoff sites of the binary η′-phase. Systematic ab initio calculations using the projected augmented wave method and Vienna Ab initio Simulation Package were used to determine the composition dependence of the structural and cohesive properties of η′-Cu6(Sn,In)5 compounds, compared with those expected from the binary end-member compounds Cu6Sn5 and Cu6In5. The molar volume shows significant deviations from Vegard?s law. The predicted composition dependence of the cohesive properties is discussed using two complementary approaches, viz. a valence-electron density approach as well as a bond-number approach, both accounting for the roughly linear dependence of the cohesive energy on the In content. A microscopic interpretation for this general trend is given in terms of the key contributions to chemical bonding in this class of compounds, namely Cu d-electron overlap and hybridization of Cu d-states with In and Sn p-electron states. Moreover, a crystallographic site approach is developed to accurately establish the phase-stabilizing effect of incorporating In at specific Wyckoff positions of the (mC44) η′-Cu6Sn5 structure.