Stand alone MOS dosimetry system for high dose ionizing radiation

INZA, M.G.; LIPOVETZKY, J.; REDIN, E.; CARBONETTO, S.; FAIGON, A.;

San Carlos de Bariloche, Argentina

Conferencia; Micro-Nanoelectronics, Technology and Applications, 2009.; 2009

Instituto Balseiro

A Metal Oxide Semiconductor (MOS) dosimetry system prototype for measurement of high dose ionizing radiation is presented. The hardware design target is to implement the Bias Controlled Cycled Measurement (BCCM) novel technique. An 8 bit microcontroller is used to control the measurement and the biasing of 4 independent MOS sensors, to interface an RS232 port for PC communications and to handle a Human Machine Interface (HMI) for basic operation. Measurement results are presented.