IN PRESS: Total Ionizing Dose Engineering Tests of microSD Memories for their use in a Cubesat Satellite

J. LIPOVETZKY, L. CHIESA, A. BURMAN,; G. RICHARTE; S. CARBONETTO, M. GARCIA INZA, E. REDIN, L. SAMBUCO, A. FAIGON

Workshop; RADECS 2012 Radiation Data Test Workshop; 2012

MicroSD memories with a capacity of 8 GB were tested for Total Ionizing Dose (TID) effects using a 60Co source under standardized conditions, for their future use in a CubeSat Satellite. Three tests were carried out, write during irradiation, data retention of the memories biased and data retention of unbiased memories. The samples were functional after the irradiation of 30 krads, but data retention errors were found after 10krads. Rewriting the memories every 5 krads doses prevented the loss of data.