Configurable platform for IC combined tests of total-ionizing dose radiation and electromagnetic immunity

BENFICA, J.; POEHLS, L.B.; VARGAS, F; LIPOVETZKY, J.; LUTENBERG, A.; GARCIA, S.E.; GATTI, E.; HERNANDEZ, F.; CALAZANS, N.L.V

Porto Gallinas, Brasil

Workshop; Latin American Test Workshop (LATW), 2011 12th; 2011

PUCRS

The roadmap for standardization of electromagnetic (EM) immunity measurement methods has reached a high degree of success with the IEC 62.132 proposal. The same understanding can be taken from the MIL-STD-883H for total ionizing dose (TID) radiation. However, no effort has been performed to measure the behavior of electronics operating under the combined effects of both, EM noise and TID radiation. For secure embedded systems and systems-on-chip (SoC) devoted to critical applications, these combined-effect measurements are mandatory. In this paper, we present a configurable platform devoted for combined tests of EM immunity and TID radiation measurements of prototype embedded systems. The platform attends the IEC 62.132-2 (for radiated EM noise), IEC 61.0004-17 and IEC 61.0004-29 (for conducted EM disturbance) and 1019.8 method for TID Test Procedure of MIL-STD-883H.