Soft X­rays spectroscopy with a commercial CMOS image sensor at room temperature

MIGUEL SOFO HARO; FABRICIO ALCALDE BESSIA; MARTı́N PÉREZ; JUAN JERÓNIMO BLOSTEIN; DARı́O FEDERICO BALMACEDA; MARIANO GOMEZ BERISSO; JOSÉ LIPOVETZKY

RADIATION PHYSICS AND CHEMISTRY (OXFORD)

PERGAMON-ELSEVIER SCIENCE LTD

Lugar: Amsterdam; Año: 2020

0969-806X

esides their application in point and shoot cameras, webcams, and cell phones, it has been shown that CMOS image sensors(CIS) can be used for dosimetry, X-ray and neutron imaging applications. In this work we will discuss the application of an ONSemiconductor MT9M001 CIS, in low energy X-ray spectroscopy. The device is a monochromatic front-side illuminated sensor,very popular in consumer electronics. In this work we introduce the configuration selected for the mentioned sensor, the imageprocessing techniques and event selection criteria, implemented in order to measure the X-ray energy in the range from 1-10 keV.Several fluorescence lines of di↵erent samples have been resolved, and for first time the line resolution have been measured andanalyzed. We achieved a FWHM of 232 eV at 6.4 keV, and we concluded that incomplete charge collection (ICC) of the chargeproduced by the X-ray contributes to the resolution, being this e↵ect more important at higher X-ray energies. The results analyzedin this work indicate that the mentioned CIS are specially suitable for X-ray applications in which energy and spatial resolutionsare simultaneously required.