INVESTIGADORES
LIPOVETZKY Jose
artículos
Título:
X-ray Micrographic Imaging System Based on COTS CMOS Sensors
Autor/es:
FABRICIO ALCALDE BESSIA; MARTIN PÉREZ; LIPOVETZKY, JOSE; NATALIA ALEJANDRA PIUNNO; HORACIO MATEOS; IVÁN SIDELNIK; JUAN JERÓNIMO BLOSTEIN; MIGUEL SOFO HARO; MARIANO GÓMEZ BERISSO, MARTÍN PÉREZ, FABRICIO PABLO ALCALDE BESSIA, IVÁN PEDRO SIDELNIK, MIGUEL SOFO HARO, JUAN JERÓNIMO BLOSTEIN, HERNÁN PASTORIZA
Revista:
INTERNATIONAL JOURNAL OF CIRCUIT THEORY AND APPLICATIONS
Editorial:
JOHN WILEY & SONS LTD
Referencias:
Lugar: LOndres; Año: 2018
ISSN:
0098-9886
Resumen:
This paper presents the use of Commercial Off The Shelf CMOS image sensors for the acquisition of X-ray images with highspatial resolution. The X-ray images, with application in biology, electronic components inspection and paleontology research,are obtained with 8 keV photons from a Cu tube. The quantum efficiency of the detector is estimated using attenuation lengths ofphotons in the sensor, and compared to traditional scintillator conversion layers. The spatial resolution observed with the sensoris limited by the charge redistribution produced after photon interaction with Si.
