A Test Platform for Dependability Analysis of SoCs Exposed to EMI and Radiation

JULIANO BENFICA; LETÍCIA MARIA BOLZANI POEHLS; FABIAN VARGAS; JOSÉ LIPOVETZKY; ARIEL LUTENBERG; EDMUNDO GATTI; FERNANDO HERNANDEZ

JOURNAL OF ELECTRONIC TESTING: THEORY AND APPLICATIONS

SPRINGER

Lugar: Berlin; Año: 2012 p. 803 - 816

0923-8174

With the IEC 62.132 proposal, the roadmap for standardization of Electromagnetic (EM) immunity measurement methods has reached a high degree of success. The same understanding can be taken from the MIL-STD-883 H for Total Ionizing Dose (TID) radiation. However, no effort has been made to measure the behavior of electronics operating under the combined effects of both, EM noise and TID radiation. For the reasons pointed out, the combined-effect measurements should be mandatory when dealing with Systems-on-Chip (SoCs) devoted to critical applications. In this paper, we present a configurable platform devoted to perform combined tests of EM immunity and TID radiation of SoCs according to the international standards.