Evaluating the Effects of Combined Total Ionizing Dose Radiation and Electromagnetic Interference

BENFICA, J; BOLZANI POEHLS L.; VARGAS F.; LIPOVETZKY, J.; LUTENBERG, A; GARCIA S.; GATTI E.; HERNANDEZ F; CASSANS L.

IEEE TRANSACTIONS ON NUCLEAR SCIENCE

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Lugar: New York; Año: 2012 vol. 59 p. 1015 - 1019

0018-9499

Although measurement methods for Electromagnetic (EM) immunity and Total Ionizing Dose (TID) radiation are highly standardized, little effort has been made though, to evaluate the behavior of embedded systems under the combined effects. Considering realistic environment conditions only the measurement of these effects can guarantee reliable embedded systems for critical applications. A configurable platform to evaluate the effects of TID radiation and EM Interference (EMI) on embedded systems is presented. Experiments illustrate the consequences regarding delay and fault occurrence probability as well as current consumption and minimum power supply.