Extension of the Measurement Range of MOS Dosimeters Using Radiation Induced Charge Neutralization

ADRIÁN FAIGÓN, JOSÉ LIPOVETZKY, E. REDIN, AND GONZALO KRUSCZENSKI

IEEE TRANSACTIONS ON NUCLEAR SCIENCE

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Lugar: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4636926&isnumber=4636880; Año: 2008 vol. 55 p. 2141 - 2147

0018-9499

Abstract—This work proposes a new measurement technique to extend the dose range of MOS dosimeters. The technique consists on alternating stages of positive oxide charge buildup with stagesof radiation induced charge neutralization, maintaining a uniform sensitivity along the whole measurement. The technique was applied with 70 nm MOS dosimeters, extending the dose measurement range fromless than a kilogray tomore than 675 kGy without showing wear effects. An initial saturation of interface traps creation ensures repeatability in the responses.