Reducing Measurement Uncertainties Using Bias Cycled Measurement in MOS Dosimetry at Different Temperatures

LIPOVETZKY, J.; REDÍN, E. G.; GARCÍA INZA, M. A.; CARBONETTO, S. H.; FAIGÓN, A.

IEEE TRANSACTIONS ON NUCLEAR SCIENCE

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Año: 2010 vol. 57 p. 848 - 853

0018-9499

Temperature dependence of MOS dosimeters response used under the Bias Controlled Cycled Measurement technique is investigated. The use of the biasing technique allows the compensation of temperature-induced changes in the response of the sensors, and reduces at least ten times the dose measurement error caused by undesired threshold voltage shifts.