INVESTIGADORES
RUANO SANDOVAL Gustavo Daniel
congresos y reuniones científicas
Título:
Beam Analysis of a CIGS Solar Cell
Autor/es:
M. TROVIANO; G. MEYER; G. RUANO; G. ZAMPIERI; H. ASCOLANI; G. BERNARDI; S. SUAREZ
Lugar:
Itapema
Reunión:
Conferencia; 20th International Conference on Ion Beam Analysis (20th IBA); 2011
Institución organizadora:
Universidade federale do rio grande do sul
Resumen:
Recent advances in science and technology have allowed the development of new materials and devices for production of renewable energies. In particular, Cu(In1-X,GaX)Se2 (CIGS)-based thin film solar cells have the highest efficiencies, in solar photovoltaics, reaching up to 20%. In the present work we study the layer composition of a CIGS film grown on a Mo/glass substrate byapplying, in first place, a Rutherford Backscattering Spectrometry (RBS) with 4.5 MeV alpha particles. Secondly, a depth profiling by Ar bombardment (3 keV) is complemented with X-ray photoemission induced with Al-K_alpha photons. The intensities of the Mg1s, F1s,Cd3d, Ga2p, Cu2p, In3d, and Se3d lines were followed. We show the compatibility between both methods, the ion beam and depth profiling by Ar sputtering, and emphasize the ion beam analysis as an easeand quickly non-destructive study.
