INVESTIGADORES
ARCE Roberto Delio
congresos y reuniones científicas
Título:
Photoconductivity measurement used to determine the defect density within the gap of intrinsec semiconductors
Autor/es:
SCHMIDT, J.A.; LONGEAUD, C; KOROPECKI, R.; ARCE, R.D.
Lugar:
La Plata
Reunión:
Workshop; Hyperfine Interactions at La Plata; 2005
Institución organizadora:
Universidad de La Plata
Resumen:
In this work we explore and dicus the information that different experiment can provide on the density of states within the gap of defective semiconductors.
