INVESTIGADORES
ARCE roberto Delio
congresos y reuniones científicas
Título:
Infrared study of the oxidation of porous silicon: evidence of surfaces modes
Autor/es:
L. N. ACQUAROLI; A. BRONDINO; J. A. SCHMIDT; R.D. ARCE; R.R. KOROPECKI
Lugar:
Islas Baleares
Reunión:
Conferencia; Porous Silicon Science Technology; 2008
Institución organizadora:
Universidad de Valencia
Resumen:
The evolution of FTIR spectra of PS during oxidation is studied in the range 450 - 1300 cm-1. We show that the small scale of the PS structure leads to a significant scattering cross sections for Fröhlich surface modes associated to stretching modes in siloxane bridges. The kinetics of the evolution of both bulk- and surface-related modes are studied using Principal Component Analysis. As a result, two independent components are found, one of them related to TO modes associated to oxide covering large structures and the other one associated to the oxidation of a distribution of prolate ellipsoids with nanoscopic size.
