INVESTIGADORES
OGGIER German Gustavo
artículos
Título:
Open Transistor Fault-Tolerant Schemes of Three-Phase Dual Active Bridge DC-DC Converters
Autor/es:
JONATHAN E. OCHOA SOSA; RUBÉN O. NÚÑEZ; GERMÁN G. OGGIER; GUILLERMO O. GARCÍA
Revista:
IEEE LATIN AMERICA TRANSACTIONS
Editorial:
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Referencias:
Lugar: New York; Año: 2020
ISSN:
1548-0992
Resumen:
This work proposes fault-tolerant schemes for open-transistor faults applied to three-phase dual active bridge converters (TPDABC), using different transformers: wye-wye, delta-delta, delta-wye, and wye-delta. The proposal consists of operating the TPDABC as a single-phase dual active bridge converter, modifying the modulation strategy. This strategy avoids the need for additional components, which allows the converter to continue operating after an event of open transistor failure. The expressions of the average power when the converter operates in the fault-tolerant modes are determined. The maximum power that can be transferred using the transformer delta-wye or wye-delta is larger than the power obtained for wye-wye and delta-delta connections. Simulation results allow the proposed schemes to be validated.
