Nitrogen Tracer Diffusion in Yttria Doped Zirconium Oxonitride

M.A. TAYLOR, M. KILO, CHR. ARGIRUSIS, G. BORCHARDT, I. VALOV, C. KORTE, J. JANEK, T.C. RÖDEL, M. LERCH

Cracovia, Polonia

Congreso; Sixth International Conference on Diffusion in Materilas, DIMAT, 2004; 2004

Anion diffusion in yttrium doped zirconium oxonitrides was investigated using the rare stable tracer 15N. The tracer was deposited onto the samples using pulsed laser deposition of zirconia in a 15N2-containing atmosphere. Diffusion anneals were performed in vacuum, and the depth distribution of the tracer was investigated using secondary ion mass spectroscopy. The observed nitrogen diffusivities are slightly higher than the ones obtained previously using samples with implanted nitrogen. The activation energy of nitrogen diffusion is above 2 eV.