The stability of PbZr0.52Ti0.48O3 prepared by the sol-gel method

R. E. ALONSO; P. DE LA PRESA; A.P. AYALA; A. LÓPEZ GARCÍA

SOLID STATE COMMUNICATIONS

Año: 1998 vol. 107 p. 183 - 187

0038-1098

Samples of PbZr0.52Ti0.48O3 (PZT) were fabricated by the Sol-Gel method and characterised by X-ray diffraction analysis. The Rietveld method was used to obtain lattice parameters and grain sizes as a function of the annealing temperature. A powder sample previously annealed at 873K was irradiated to activate the 181Ta probe. Then, Perturbed Angular Correlation (PAC) spectra were measured at RT and temperatures above 873K to study the thermal behaviour on samples capsulated in SiO2 tubes. The hyperfine parameters observed as a function of temperature show changes in this PZT compound that would correspond to thermal evolution of defects. Furthermore, the reaction of PZT with the substrate was observed at 1173K, obtaining at this temperature the hyperfine parameters corresponding to SiZrO4. At this temperature no trace of the PZT was left.