Electrical behavior of cerium dioxide films exposed to different gases atmospheres

R. C. DEUS; R.A.C AMORESI; P.M. DESIMONE ; F. SCHIPANI; L.S.R. ROCHA; M.A. PONCE; A.Z. SIMOES; E. LONGO

CERAMICS INTERNATIONAL

ELSEVIER SCI LTD

Lugar: Amsterdam; Año: 2016 vol. 42 p. 15023 - 15029

0272-8842

Here we present an easy-reproducible microwave-assisted hydrothermal route for preparing pure nanocrystallineCeO2 films. The produced materials were characterized using a wide range of techniques(X-ray diffraction, field emission gun scanning electron microscopy, Raman spectroscopy) to understandthe synthesis dependent changes in crystallographic structure, and crystallite size. Raman and X-raydiffraction techniques revealed that the films were free of secondary phases and that they crystallize inthe cubic structure. The observed hydrodynamic particle size larger than the crystallite size confirms theaggregation phenomenon. Gas sensing measurements have been carried out to rationalize the type andnumber of surface adsorbed groups and overall nanostructure. Electrical conductance variations, owingto gases adsorption onto semiconductor oxide films surfaces, were observed in this work. ChemiresistiveCeO2 film properties depend on the intergranular barrier heights and width.& 2016 Elsevier Ltd and Techna Group S.r.l. All rights reserved.