INVESTIGADORES
MIGUEL Maria De La Paz
artículos
Título:
Correction of optical distortions in dry depth profiling with confocal Raman microspectroscopy
Autor/es:
TOMBA J.P.; DE LA PAZ MIGUEL, M; PEREZ, C.J
Revista:
JOURNAL OF RAMAN SPECTROSCOPY
Editorial:
JOHN WILEY & SONS LTD
Referencias:
Lugar: Londres; Año: 2011 vol. 42 p. 1330 - 1334
ISSN:
0377-0486
Resumen:
We present a generalized approach to obtain improved Raman intensity profiles from in-depth studies performed by confocal
Ramanmicrospectroscopy (CRM) with dry objectives. The approach is based on regularized deconvolution of the as-measured
confocal profile, through a kernel that simulates optical distortions due to diffraction, refraction and collection efficiency on
the depth response. No specific shape or restrictions for the recovered profile are imposed. The strategy was tested by probing,
under different instrumental conditions, a series of model planar interfaces, generated by the contact of polymeric films of
well-defined thicknesswith a substrate. Because of the aforementioned optical distortions, the as-measured confocal response
of the films appeared highly distorted and featureless. The signal computed after deconvolution recovers all the films features,
matching very closely with the response expected. Copyrightc 2011 John Wiley & Sons, Ltd.