Multiple ionization of atoms including post-collisional contributions

C. C. MONTANARI

Belfast

Congreso; XXVII International Conference on Photonic, Electronic, and Atomic Collisions Belfast, 2011; 2011

International Scientific Committee of the International Conference on Photonic, Electronic, and Atomic Collisions

Ion-atom multiple ionization is one of the most complicated processes to study. It demands not only elaborated collision theory, but also a detailed knowledge of the post-collisional processes which determine the ultimate charge measured by the experiments. There are different mechanisms that produce time-delay electron emission (Auger and Coster?Krönig proceses, electrón shake-off, excitation followed by double Auger), which are related to the post-collisional state of the target [1], and are independent of the ion nature or impact energy. In recent years the combination of theoretical ionization probabilities with experimental rates of post-collisional electron emission in photoionization experiments [2-3], has given new impulse to the theoretical and experimental research on this subject [4-7]. Our calculations combine full CDW-EIS impact parameter probabilities and recent photoionization branching ratios [8]. In this opportunity we will present results for single to quintuple ionization cross sections for Ne, Ar, Kr, and Xe bombarded by different ions and charge states, in the intermediate to high energy range, and compare them with the available experimental data.