Gas in-diffusion contribution to impedance in tin oxide thick films

M.A. PONCE, C. MALAGU, M.C. CAROTTA, G. MARTINELLI, Y C.M. ALDAO

JOURNAL OF APPLIED PHYSICS

AMER INST PHYSICS

Año: 2008 vol. 104 p. 54907 - 54907

0021-8979

The ac electrical resistance and capacitance of SnO2 thick films under vacuum and air atmosphere were analyzed using the Cole–Cole plot. To fit the experimental results, a simple circuit model that considers a capacitance and a resistance in parallel was employed. An explanation for the resistance variation considering spherical grains with different characteristics is proposed. A careful analysis of the resulting depletion layers and doping levels gives evidence for gas diffusion into the grains.