Analyzes of glasses of Ge-Se-Ag system employing synchrotron radiation and complementary techniques

J. M. CONDE GARRIDO; M. ERAZÚ; J. A. ROCCA; M. A. UREÑA; M. FONTANA; B. ARCONDO

Campinas, Brasil

Congreso; 6th International Conference on Synchrotron Radiation on Materials Science; 2008

.O {font-size:149%;} <!--.sld {left:0px !important; width:6.0in !important; height:8.66in !important; font-size:150% !important;} --> My(GexSe1-x)1-y glasses, with M = Ag, Cu, Fe or their combination were obtained as bulk glasses by melt quenching technique and, as films, by pulsed laser deposition (PLD). Ag and Cu addition, above a threshold concentration, turn over the semiconductor nature of GexSe1-x glasses to a fast ionic behavior. On the other hand, the addition of a small quantity of Fe confers the glasses very peculiar magnetic behavior. Scanning electron microscopy (SEM) and small angle X-ray scattering (SAXS) were employed to analyze homogeneity in these glasses.  X-ray diffractometry (XRD) and Mössbauer spectroscopy (MS) were used in structure studies. Extended X-ray absorption fine structure (EXAFS) was employed to characterize the local environment of the Ge atoms. Magnetic moments were measured as a function of temperature and magnetic field for Fe containing glasses. Finally, electric and magnetic behavior were analyzed as a function of structure, composition and local order in these glasses.