Design and test of Gd-based layers for X-ray detection efficiency enhancement of COTS CMOS image sensors

M. PEREZ; M. SOFO HARO; E. MARTINEZ; A. CICUTIN; M. CRESPO; F. ALCALDE BESSIA; J. J. BLOSTEIN; M. GOMEZ; J. LIPOVETZKY

Congreso; Congreso Argentino de Electrónica; 2023

In this work, we present the development andevaluation of intensification layers (IL) employed to enhancethe X-rays detection efficiency of thin semiconductor detectors.The IL could be used, in conjunction with position-sensitivedetectors, for the acquisition of high spatial resolution X-rayimages. In a first proof of concept, we evaluate the performanceof COTS CMOS image sensors covered with IL based on NaGdF 4nanoparticles and Gd 2 O 3 employing photons emitted by an X-ray tube with a tungsten anode.