Kinetic adhesion of antibody to a silicon wafer studied by laser reflectometry

RIQUELME, BD; RIUS, SP; BOZZA, VV; VALVERDE, JR; RASIA, RJ

SPIE

Año: 2000 vol. 3911 p. 19 - 26

0277-786X

AbstractStudy of biomolecular interaction dynamics and relations between their structure and function is very important for the understanding of biological system. The laser diffractometry technique, as well as the surface plasmon resonance technique, can give information about the interaction kinetics, molecular binding stoichiometry, and the concentration of molecules in a solution. This method offers detailed and accurate determination of real-time adsorption kinetics of protein without labeling of the protein. When the polarized light is reflected on a solid surface, the reflectance has a minimum at the principal incidence angle. As the proteins are adsorbed over the surface the reflectance increases. Therefore, the temporal register of reflected intensity gives curves representing the binding kinetics of antibody in real-time. The technique is highly sensible because of the great difference in the refractive index between silicon and organic material. This method was applied to study the adhesion kinetics of monoclonal anti-AB antibodies at surface of a silicon wafer. The mathematical analysis of results would suggest that the antibody association occurs according to classical Langmuir surface adsorption. This analysis permits to obtain the adhesion and dissociation of the antibody.