Monte Carlo study of the two correlated stochastic processes: Random Sequential Deposition of dimmers on nonuniform surfaces

E.S. LOSCAR; R. A. BORZI; E. S. ALBANO

Colonia del Sacramento, Uruguay.

Conferencia; XIII Conference on Nonequilibrium Statistical Mechanics and Nonlinear Physics (Medyfinol' 02); 2002

Statistical and nonlinear physics community in Latin-America.

We present the results of a study of jamming phenomena for random sequential deposition (RSD) on discrete nonuniform substrates. It is an interesting example of two correlated stochastic processes. The physical features underlying on each processes and the interplay between them  can be analyzed successfully with careful definitions and measurements of the relevant quantity (different RMS of the jamming threshold). Characteristic  power law or divergence logarithm behavior can appear mimicking some of the two sampling. For the universal power law behavior, we suggest that there is no link between this finite scaling and the critical behavior. Instead of it, the analytical expression v = 2 / (2D - df) is found for the exponent v associated with the finite size scaling of the variance, which shows its dependence with both the dimension of the space (D) and the dimension of the volume of substrate which can allocate the adsorbed entities (df). Monte Carlo simulations of RSD of dimmers are in very good agreement with this relation, in examples that include substrates with fractal dimension.