Substrate influence in the physical properties of ferromagnetic/ ferroelectric multilayers

GONZALEZ SUTTER; AVILES FELIX; HENRIQUEZ; BARRIENTOS; KAUL; HABERKORN, N: ; SIRENA, M.; STEREN, L.B.; BERGEAL, N., LESUEUR, J.,; BERNARD, R., AND BRIATICO, J.

Conferencia; X Latin-American Workshop on Magnetism, Magnetic Materials and their Applications; 2013

La0.67Mn0.33MnO3 (ferromagnetic) / BaTiO3 (ferroelectric) bilayers and multilayers were grown by sputtering over dierent substrates. The in uence of the substrate and the layers thicknesses in the physical properties of FE/FM multilayers were studied by magnetization and transport techniques. A phenomenological approach [1] is used to analyze the electrical transport in ferromagnetic (FM)/ferroelectric (FE) bilayers, using conductive atomic force microscopy (CAFM). Structural and electrical characterization of ultra-thin ferroelectric layers grown over ferromagnetic electrodes is critical for the development of multiferroic tunnel junctions.