Structural and transport characterization of ultra thin Ba0.05Sr0.95TiO3 layers grown over Nb electrodes for the development of Josephson junctions

M. SIRENA ; L. AVILES FELIX; G. A. CARVACHO VERA; H. L. NAVARRO FERNANDEZ; L. B. STEREN; R. BERNARD ; J. BRIATICO; N. BERGEAL AND G. FAINI; J. LESUEUR; G. FAINI

APPLIED PHYSICS LETTERS

AMER INST PHYSICS

Lugar: New York; Año: 2012 vol. 100 p. 12602 - 12605

0003-6951

A phenomenological approach was used to obtain critical information about the structure andelectrical properties of ultra thin Ba0.05Sr0.95TiO3 (BSTO) layers over Nb electrodes. The methodallows, in a simple way, to study and to optimize the growth of the barrier in order to improve theperformance and application of Josephson junctions. A very good control of the layer thicknesswith a low roughness was achieved during the deposition process. The BSTO layers present anenergy barrier of 0.6 eV and an attenuation length of 0.4 nm, indicating its good insulatingproperties for the development of Josephson junction