Construction of a quartz spherical analyzer: Application to high-resolution analysis of the Ni Kα emission spectrum

M. G. HONNICKE; L. BIANCO; S. A. CEPPI; C. CUSATIS; X. HUANG; Y. Q. CAI; G. STUTZ

JOURNAL OF APPLIED CRYSTALLOGRAPHY

WILEY-BLACKWELL PUBLISHING, INC

Lugar: Londres; Año: 2016 vol. 49 p. 1443 - 1453

0021-8898

The construction and characterization of a focusing X-ray spherical analyzer based on α-quartz 404 are presented. The performance of the analyzer was demonstrated by applying it to a high-resolution X-ray spectroscopy study of the Kα1,2 emission spectrum of Ni. An analytical representation based on physical grounds was assumed to model the shape of the X-ray emission lines. Satellite structures assigned to 3d spectator hole transitions were resolved and determined as well as their relative contribution to the emission spectrum. The present results on 1s-13d-1 shake probabilities support a recently proposed calculation framework based on a multi-configuration atomic model.The construction of an α-quartz spherical analyzer and its application to a high-resolution measurement of the Kα1,2 X-ray emission lines of Ni are presented