Standardless method for PIXE analysis

TABATHA RODRÍGUEZ; SILVINA LIMANDRI; JORGE TRINCAVELLI

Split

Congreso; 15th International Conference on Particle Induced X-ray Emission; 2017

A method based on the refinement of atomic and experimental parameters developed for the description of PIXE spectra is presented and applied to standardless semi-quantitative PIXE analysis. This method was implemented in the sofware PAMPA (Parameter Assessment Method for PIXE Analysis) and consists in minimizing the quadratic differences between an experimental spectrum and an analytical function proposed to describe it. The first results of PAMPA are presented for the quantification of synthetic and mineral, thin and bulk samples, and they were compared with results obtained with a commercial software.p { line-height: 120%; }a:link { }