INVESTIGADORES
TRINCAVELLI Jorge Carlos
artículos
Título:
Spectral distribution of backscattered electrons: application to electron probe microanalysis
Autor/es:
MARCELO DEL GIORGIO; JORGE TRINCAVELLI; JOSÉ A. RIVEROS
Revista:
X-RAY SPECTROMETRY
Editorial:
JOHN WILEY & SONS LTD
Referencias:
Año: 1990 vol. 19 p. 261 - 267
ISSN:
0049-8246
Resumen:
The parameters Phi0 and Gamma0 of the Gaussian model for the depth distribution of characteristic x-ray production Phi(rho z) were evaluated using an analytical expression for the energy distribution of backscatrered electrons. The expressions obtained were compared with those which do not take into account this distribution. A test of the usefulness of both models was performed for microanalysis corrections.
