Peak-to-background method for standardless electron microprobe analysis of particles

JORGE TRINCAVELLI; RENÉ VAN GRIEKEN

X-RAY SPECTROMETRY

JOHN WILEY & SONS LTD

Año: 1994 vol. 23 p. 254 - 260

0049-8246

A peak-to-background method was implemented for standardless electron microprobe analysis of bulk samples and particles. First, a study on the choice of the beam entry point was performed; the region of the particle closest to the detector proved to be the most convenient. Then, a very simple algorithm, which does not require any kind of standard, was developed for particle analysis. This method was tested for glass standard particles and the results were compared with those given by other methods; the proposed standardless approach appeared to yield very satisfactory results.