INVESTIGADORES
SIGNORELLI Javier Walter
artículos
Título:
Measurement of In-Grain Orientation Gradients by EBSD and Comparison with Finite Element Results
Autor/es:
L. DELANNAY; R.LOGÉ; Y. CHASTEL; J.W. SIGNORELLI; P. VAN HOUTTE
Revista:
ADVANCED ENGINEERING MATERIALS (PRINT)
Editorial:
WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Referencias:
Año: 2003 vol. 5 p. 597 - 600
ISSN:
1438-1656
Resumen:
The characterization of In-grain orientation gradients by electron backscattering diffraction (EBSD) technique was studied. The study, based on finite element (FE) technique, involved the simulation of plane strain compression of the crystal grains. In regard to it, the construction of orientation distribution function (ODF) by superimposing spherical Gaussian distributions on the mean orientation of grains was also discussed.
