Measuring stacking fault densities in shock-compressed FCC crystals using in situ x-ray diffraction

K. ROSOLANKOVA; J.S. WARK; E.M. BRINGA; J.A. HAWRELIAK

JOURNAL OF PHYSICS CONDENSED MATTER

IOP PUBLISHING LTD

Año: 2006 vol. 18 p. 6749 - 6758

0953-8984

A method is presented of in situ measurements of stacking fault densities in shocked face-centred-cubic (FCC) crystals using x-ray diffraction. Using results from both the second and fourth diffraction orders, wherein shifts in the Bragg peaks due to faulting are accounted for, we calculated fault densities present in a molecular dynamics (MD) simulation of shocked single crystal of copper. The results are in good quantitative agreement with dislocation density measurements inferred directly from the MD simulation. The x-ray diffraction method thus presents a real possibility for experimental determination in real time of dislocation densities in crystals during shock wave passage.