X-ray diffraction of electrodeposited nanocrystalline nickel under high pressure

C.D. GRANT; J.C. CROWHURST; T. ARSENLIS; E.M. BRINGA; Y.M. WANG; J.A. HAWRELIAK; P.J. PAUZAUSKIE; S.M. CLARK

JOURNAL OF APPLIED PHYSICS

AMER INST PHYSICS

Lugar: American Institute of Physics; Año: 2009 vol. 105 p. 84311 - 84317

0021-8979

We studied the compressibility of monolithic fully dense electrodeposited nanocrystalline Ni ( ∼ 29 nm grain size) under both quasihydrostatic and nonhydrostatic conditions up to a nominal pressure of 50 GPa using angle-dispersive x-ray diffraction. We obtained an equation of state consistently and unambiguously from each measured reflection. The apparent bulk modulus measured under nonhydrostatic conditions is larger than that of the corresponding coarse-grained material under either type of compression, but is nearly the same when measured under quasihydrostatic conditions. These results may be consistent with a strength, but not necessarily a bulk modulus, that is enhanced in the nanomaterial relative to its coarse-grained counterparts.