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Magneto-Optic Kerr Effect (MOKE) is one of the most suitabletechniques to study superficial magnetization phenomena due to its limited material penetration (~20 nm for most of metals). It is widely used in nanomagnetism for its considerable surface sensitivity and relativelysimple assembleand operation. The technique is able to sense both, changes in theorientationof electric field polarization plane,and light intensity variations of a monochromaticlinearly polarized beam after being reflected by a magnetized surface material. Briefly,the magnetization alters the dielectric tensor of the sample, making it optically anisotropic and hence, modifying the reflection propertiesof the surface.Ina previous worka new method was introduced toquantitatively and simultaneouslymeasurethe two magnetization components parallelto the plane of the film(v-MOKE).Even when this method is accurate and easy to implement, it presents the disadvantage that it is necessaryto rotate the electromagnet.Depending onitsdimension and weight,implementing this task could be, in practice,complex or directly unfeasible.Here, we introduce analternative method aimed to quantitatively compare the two magnetization components parallel tothesample film in v-MOKE experiments.The proposalpresents theadvantage of afix electromagnet (as well as all other components of the experimental setup), which might be very convenientfor most v-MOKE devices. Consequently, theproposed procedureallows acquiring simultaneouslyand quantitatively both in-planemagnetization components with a fixed experimental arrangement.Two films,FePt 9 and 100 nm thickness,were used as sampleprobes, presenting in-plane magnetic uniaxial anisotropyand in-plane magnetic isotropy, respectively. All experiments were carried out at room temperature by employing a home-madeMOKE system.