M-subshell x-ray production cross sections of Re and Os by electron impact

AGUILAR, ALFREDO; CASTELLANO, GUSTAVO; SEGUI, SILVINA; TRINCAVELLI, JORGE; CARRERAS, ALEJO

JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY

ROYAL SOC CHEMISTRY

Lugar: CAMBRIDGE; Año: 2023 vol. 38 p. 751 - 757

0267-9477

X-ray production cross sections were experimentally determined for the five M subshells of Reand Os by electron impact. Incident beam energies between 2.5 and 28 keV were used to thisaim, irradiating Re and Os thick targets in a scanning electron microscope. X-ray emission spec-tra were recorded with an energy dispersive spectrometer, and were processed through a carefulparameter optimization routine previously developed. The x-ray production cross sections werethen determined through an approach which involves an analytical function predicting the mea-sured spectra through calculations based on the ionization depth distribution function. The resultsobtained were compared with empirical and theoretical predictions by means of relaxation datataken from the literature.