Standardless SR-XRF analysis of small amount mineral samples.

D`ANGELO, JOSÉ A; PERINO, ERNESTO; MARCHEVSKY, EDUARDO; RIVEROS, JOSÉ A

São Pedro, São Pablo, Brasil

Otro; VII Seminario Latinoamericano de Análisis por Técnicas de Rayos X (SARX 2000); 2000

Univ. de Campinas, São Pablo, Brasil

Analytical results obtained by a standardless synchrotron radiation X-ray fluorescence (SR-XRF) method are presented. Small samples (~30mg/cm2) are mounted on suitable substrates. Intensity reduction of fluorescent lines emitted by substrates is analyzed. The method is applied to determine sample mass-thickness. Concentrations of sample`s constituent (ranging from major to trace elements) are also determined. Although this method is used to characterize minerals it may also be applied to several kind of samples. The choice of the substrate depends on the number of elements to be analyzed, since sample concentrations are determined through the attenuation of substrate lines.