K-S RELATIONSHIP IDENTIFICATION TECHNIQUE BY EBSD

M.C. MARINELLI; M.G. MOSCATO; J.W.SIGNORELLI; A. EL BARTALI; I. ALVAREZ-ARMAS

Brno

Conferencia; 6th International conference Materials Structure & Micromechanics of Fracture; 2010

This paper focuses on the identification of activated slip system in flat specimens of hotand cold-rolled UNS S32750 DSS plates subjected to low-cycle fatigue, paying particular attention on the existence of the K-S relationship. Electron Backscattered Diffraction (EBSD) technique was used to determine the local crystallographic properties of both phases. Although 27182 couples of alpha/gamma grains were analyzed, the crystallographic K-S relationships were rarely observed between them. As a conclusion, it was observed that microcracks were mostly nucleated at grain boundaries and rarely at the extrusions.