UNIDEF   23986
UNIDAD DE INVESTIGACION Y DESARROLLO ESTRATEGICO PARA LA DEFENSA
Unidad Ejecutora - UE
artículos
Título:
Nanocrystalline ZnO photoconductivity measurements
Autor/es:
C.D. BOJORGE; BIANCHETTI MARIO F.; GOMEZ N.A.; N.E. WALSÖE DE RECA; CANEPA H.
Revista:
Procedia Materials Science
Editorial:
Elsevier
Referencias:
Año: 2012 vol. 1 p. 614 - 619
ISSN:
2211-8128
Resumen:
Pure ZnO have been prepared on amorphous SiO2 substrates from a precursor solution of dihydrated zinc acetate andabsolute alcohol. The sol was deposited on the substrates by the spin-coating technique. After de deposit of each layer, adrying treatment was performed at 200 ºC for10 min, to solidify the deposited material. Finally, all the specimens werethermally treated at 450 ºC for 3 h to crystallize them. The characterization by X rays diffraction was performed using theglancing angle configuration and films morphology was observed with an Atomic Force Microscope and by FieldEmission Scanning Electron Microscopy. Photoconductivity was studied in function of the wavelength at 50 ºC using thefour-points method and illuminating by arrays of LEDs with different wavelengths.