INVESTIGADORES
CAPPELLETTI Marcelo Angel
congresos y reuniones científicas
Título:
A Computerized Method for Carrier Lifetime Measurement in PN Junctions at High and Low-Level Injection
Autor/es:
SEBASTIÁN MONTERO; ARIEL PABLO CÉDOLA; MARCELO ANGEL CAPPELLETTI; EITEL LEOPOLDO PELTZER Y BLANCÁ
Lugar:
Montevideo
Reunión:
Conferencia; 4th Argentine - 1st Uruguay Conference on Micro-Nanoelectronics, Technology, and Applications (CAMTA - CUMTA); 2010
Institución organizadora:
IEEE y Universidad de la República-Universidad Católica, Montevideo, Uruguay
Resumen:
A system to determine the minority carrier lifetime in PN semiconductor junctions in the range of 50 ns to 100 μs has been developed. The measurement is performed by using the Open Circuit Voltage Decay (OCVD) technique. The equipment consists mainly of a data acquisition system based on a PIC16F877A microcontroller, connected to a computer, and software for the control of the entire system, data processing, storage and visualization of results.
