· Nitrogen Tracer Diffusion in Yttria Doped Zirconium Oxonitride

MARCELA ANDREA TAYLOR; M. KILO; C. ARGIRUSIS; G. BORCHARDT; I. VALOV; C. KORTE; J. JANEK; T. C. RODEL; M. LERCH

DEFECT AND DIFFUSION FORUM

Trans. Tech. Publications

Año: 2005 vol. 479 p. 237 - 240

1012-0386

<!-- /* Style Definitions */ p.MsoNormal, li.MsoNormal, div.MsoNormal {mso-style-parent:""; margin:0cm; margin-bottom:.0001pt; mso-pagination:widow-orphan; font-size:12.0pt; font-family:"Times New Roman"; mso-fareast-font-family:"Times New Roman"; mso-ansi-language:ES-AR; mso-fareast-language:ES-AR;} @page Section1 {size:612.0pt 792.0pt; margin:70.85pt 3.0cm 70.85pt 3.0cm; mso-header-margin:35.4pt; mso-footer-margin:35.4pt; mso-paper-source:0;} div.Section1 {page:Section1;} --> Anion diffusion in yttrium doped zirconium oxonitrides was investigated using the rare stable tracer 15N. The tracer was deposited onto the samples using pulsed laser deposition of the zirconia in a 15N2-containig atmosphere. Diffusion anneals were performed in vacuum, and the depth distribution of the tracer was investigated using secondary ion mass spectroscopy. The observed nitrogen diffusivities are slightly higher than the ions obtained previously using samples with implanted nitrogen. The activation energy of nitrogen diffusion is above 2 eV