Effects of the chelating agent on the fabrication of SBT thin films: Part II. Microstructural properties

A. FRATTINI; R.MACHADO; M.L. SANTIAGO; N. PELLEGRI; STACHIOTTI, MARCELO; R. BOLMARO; O DE SANCTIS

FERROELECTRICS

Taylor & Francis

Lugar: Philadelphia; Año: 2006 vol. 335 p. 35 - 43

0015-0193

The effects of the chelating agent on the micro structural properties of SBT thin films annealed at different temperatures are investigated. The films were prepared on Pt/Ti/SiO2/Si substrates by a chemical solution deposition technique. Strontium acetate, bismuth nitrate and tantalum ethoxide were used as precursor materials, with methanol and glacial acetic as solvents. We make a comparative investigation of the surface microstructure, grain size distribution, crystallinity, and degree of crystal orientation for films prepared using acetoin and alkanolamines as chelating agent.