Thermal cycling at constant stress for thin films over a wide temperature range: design and fabrication of a specific device for the study of microactuators

MALVASIO, B.F.; ISOLA, L.M.; MALARRIA, J.A.

REVIEW OF SCIENTIFIC INSTRUMENTS

AMERICAN INSTITUTE OF PHYSICS

Lugar: New York; Año: 2023 p. 43904 - 43910

0034-6748

The characterization of the mechanical behavior of shape memory thinfilm alloys is essential for their application as microactuators. Depending onthe particular application, different elements have been considered for thefabrication of ternary NiTi-based alloys, in order to shift the martensitictransformation towards a lower or a higher temperature range. This workpresents the design and implementation of a specific device to perform thermalcycles at constant stress on film-like samples over a wide temperature range,between -130 C and 300 C. The uniaxial stress application, the elongations andcontractions measurements associated with the martensitic transformations andthe cooling and heating methods are detailed in the present work. Thefabrication and operation features of this relatively low cost device facilitatesand promotes the study of shape memory thin films.