Preparation and structural characterization of Py thin films on Si, and Al2O3 substrates

ANDRÉS MARTÍNEZ; MERCEDES ARANA; BENJAMIN SALLES; PAULA G. BERCOFF

Ouro Preto

Congreso; Reunión de Otoño de la Sociedad Brasilera de Física 2023; 2023

Permalloy (Py) exhibits interesting properties such as high saturation magnetization, ferromagnetic properties at room temperature, and coercivity depending on the thickness, making it interesting for various applications. In this study, thin films of Ni81Fe19 were prepared using DC magnetron sputtering on substrates of porous alumina (Al2O3) and Si. The porous alumina membranes feature nano-holes in the upper surface and nano-domes in the bottom surface, with a center-to-center distance of approximately 100 nm. Three thicknesses of Py were deposited on the silicon, alumina nano-domes and nano-holes. For structural characterization, the grazing incidence X-ray diffraction (GIXRD) technique was employed and X-ray reflectometry (XRR) was used to determine the thickness of the films. The growth of Py on porous alumina is significant as it can enable the creation of skyrmions, which could be applied to high-density magnetic information storage.