INELASTIC HARD X-RAY SCATTERING SPECTROSCOPY: RESULTS AT UVX/LNLS AND PROPOSALS FOR SIRIUS

O. A. PAREDES MELLONE; S. A. CEPPI; G. STUTZ; S. LIMANDRI

Campinas

Congreso; 29th Annual Users meeting LNLS; 2019

LNLS

Since the advent of high-brightness radiation sources in the range of hard X-rays, spectroscopic studies based on the inelastic scattering of X-rays have gained a growing interest due to the feasibility of performing experiments with high energy resolution and a high photon flux. A general breakthrough in this technique was driven by high brilliance undulators inserted at high-energy third-generation synchrotrons, providing new experimental possibilities. Inelastic X-ray scattering (IXS) spectroscopy comprises multiple regimes, which are able to provide fundamental information about the electron system in the condensed matter, as excitation dynamic of a many-electron system, structure of unoccupied electronic states, core-hole interactions or ground state properties of the scattering electron system [1]. Additionally, the use of a high penetrating probe (hard X-rays) allows that true bulk information can be obtained and that samples in special environments can be investigated. This way, IXS has become a well established technique in the last years, having been implemented in dedicated beamlines at several synchrotron radiation laboratories around the world. Inelastic X-ray scattering has been also applied to a broad range of analytical studies, among others, high pressure studies of materials of interest in geophysics [2], IN-SITU studies of processes and materials for energy applications [3] or spectroscopic tomography with sensitivity to light elements and chemical contrast [4]. Our work performed in the field of IXS at UVX/LNLS in the last years [5-7] will be summarized, new IXS experiments that could be carried out at SIRIUS will be discussed and new related instrumentation, in particular X-ray analyzers for IXS will be proposed.