IFEG   20353
INSTITUTO DE FISICA ENRIQUE GAVIOLA
Unidad Ejecutora - UE
congresos y reuniones científicas
Título:
Experimental Methodology for Retrieving Chemical State Information from L lines by Resonant Inelastic X-Ray Scattering
Autor/es:
ROBLEDO J. I.; SÁNCHEZ J. H.; LEANI J. J.
Lugar:
Ljubljana
Reunión:
Conferencia; European Conference on X-Ray Spectrometry; 2018
Institución organizadora:
Jo?ef Stefan Institute
Resumen:
By way of Resonant Inelastic X-Ray Scattering (RIXS), also named X-ray Resonant Raman Scattering (RRS), the speciation of samples can be attained in a variety of experimental conditions, as total reflection, grazing incidence and even confocal setups [1-4]. Until now, this discrimination methodology had been applied only to K lines, i.e. for transitions from the L to the K internal shells. Because of this, there is a lack in knowledge about the sensitivity of the method for the discrimination of compounds by the analysis of L lines, i.e. for transitions from the M to the L atomic shells. In this work, the first results of speciation of several element compounds using this novel RIXS tool are presented. The measurements were performed at the Brazilian Synchrotron Light Source (LNLS, Campinas) in the D09B-XRF beamline using the typical 45°-45° geometry and an energy dispersive system. The incident beam energies were selected just beneath the different L absorption edges of the studied elements. Spectra were analyzed by two independent mathematical methods: fine structure deconvolution and Principal Component Analysis (PCA). After the data processing using multivariate methods, the results show a clear discrimination of the different element compounds. The outcome is significant since this novel RIXS tool allowed observing different species of the studied elements by means of the inspection of the L lines. Basis and comparisons with the characterization power by the analysis of K lines by RIXS are discussed. [1] J.I. Robledo, J.J. Leani, A.G. Karydas, A. Migliori, C.A. Pérez, H.J. Sánchez, Analytical Chemistry, ID: AC2017-04624s.R1. (2018). [2] J.J. Leani, J.I. Robledo, H.J. Sánchez, X-Ray Spectrometry, doi: 10.1002/xrs.2782 (2017). [3] J.J. Leani, R.D. Pérez, J.I. Robledo, H.J. Sánchez, Journal of Analytical Atomic Spectrometry 32, 402 (2017). [4] J.I. Robledo, H.J. Sánchez, J.J. Leani, C.A. Pérez, Analytical Chemistry 87, 3639 (2015).