Oxide Nano-layers in Stratified Samples Studied by X-ray Raman Scattering at Grazing Incidence

JUAN JOSÉ LEANI; H.J. SÁNCHEZ; C.A. PEREZ

Journal of Spectroscopy

Hindawi

Lugar: Londres; Año: 2015 vol. 2015 p. 1 - 7

2314-4920

X-ray resonant Raman scattering is applied at grazing incidence conditions with the aimof discriminating and identifying chemicalenvironment of iron in different layers of stratified materials using a low resolution energy dispersive system. The methodologyallows for depth studies with nanometric resolution. Nanostratified samples of Fe oxides were studied at the Brazilian synchrotronfacility (LNLS) using monochromatic radiation and an EDS setup.The measurements were carried out in grazing incident regimewith incident photon energy lower than and close to the Fe-K absorption edge. The result allowed for characterizing oxidenanolayers, not observable with conventional geometries, identifying the oxidation state present in a particular depth of a samplesurface with nanometric, or even subnanometric, resolution using a low-resolution system.