Ion fractions in 6 keV Ne+, Ar+ and Na+ scattering from a GaAs( 110) surface

G. R. GÓMEZ; J. E. GAYONE; O. GRIZZI; E. A. SÁNCHEZ; R. G. PREGLIASCO; M. L MARTIARENA; GARCIA E.; E. C. GOLDBERG

NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH B - BEAM INTERACTIONS WITH MATERIALS AND ATOMS

ELSEVIER SCIENCE BV

Lugar: Amsterdam; Año: 1997 vol. 125 p. 268 - 272

0168-583X

We used Ion Scattering Spectrometry (KS) with Time-of-Flight (TOF) analysis to study the neutralization of 6 keV Ne+,Ar+ and Na+ backscattering from a flat and ordered GaAs(1 IO> surface. At low incident angles an important contribution tothe total (neutral + ion) backscattering spectra comes from quasi single collisions with As and Ga first layer surface atoms.We observed that the ion fraction in this contribution is strongly dependent on both the incident projectile and the targetatom, suggesting that the violent collision plays an important role in the neutralization process. In order to interpret thesedependencies we performed a calculation that discriminates the interaction of the projectile with the extended and localizedstates of the solid.