Direct Recoil Spectroscopy of Atoms and Self-Assembled Monolayers at Surfaces

L. SALAZAR ALARCON; V.A. ESAULOV; J.E. GAYONE; E.A. SANCHEZ; O. GRIZZI

Conferencia; 21 International Conference on Ion Surface Interactions; 2013

Direct Recoil Spectroscopy (DRS) is a variation of the better known Ion Scattering Spectroscopy in which the observation is set at forward angles with the aim of detecting primary recoiled particles (adsorbed and substrate atoms) together with the scattered projectiles. In contrast with the backscattering geometry, here the information about the surface comes from the analysis of the intensity of recoiled particles. With the exception of some specific cases, the ion fractions in recoils are very small, making the Time of Flight (TOF) method the preferred one for spectroscopy. For more than ten years the system has been used to study different cases of adsorption phenomena; selected examples of atoms (H) and molecule adsorption forming self-assembled monolayers (dithiols, PTCDI) are described below. The examples shown are chosen with the aim of describing systems of present interest where DRS has a special or unique facility to response to an specific question.