INVESTIGADORES
SANCHEZ Esteban Alejandro
artículos
Título:
TOF-Ion Scattering Spectrometer for Surface Analysis: Application to GaAs(110) Surface
Autor/es:
R.G. PREGLIASCO; J.E. GAYONE; E.A. SANCHEZ; O. GRIZZI
Revista:
AIP CONFERENCE PROCEEDINGS
Editorial:
AIP Press
Referencias:
Lugar: New York; Año: 1994 vol. 378 p. 84 - 88
ISSN:
0094-243X
Resumen:
We present our new time of flight spectrometer. A clean GaAs(110) surface has been prepared by:i) standard cycles of ion bombardment and annealing, ii) cycles of grazing ion bombardment and annealing. We have found that the surface can be smoothed out by this last method. we have measured the intensity of 5 keV Ne backscattering from the surface for differente incidence directions. the scattering features are in good agrrment with the accepted surface relaxation.
