Microstructure anisotropy in CuO powders

A. E. BIANCHI; L. MONTENEGRO; R. VIÑA; G. PUNTE

POWDER DIFFRACTION

JCPDS-International Centre for Diffraction Data

Año: 2008 vol. 23 p. 81 - 86

0885-7156

An anisotropic line broadening study of CuO is reported. X-ray powder diffraction line widthmodifications observed are modeled when comparing data coming from
1 commercial analyticalgrade CuO,
2 energetic ball milling sample for 1 h, and
3 samples prepared by thermallyannealing the ball milled sample at various temperatures. X-ray powder diffraction data fromcommercial and produced samples were analyzed by the Rietveld method using a pseudo-Voigtfunction. Different assumptions including size and strain anisotropy were tried to improve patternfitting. An anisotropic strain broadening, modeled using Stephens’ approximation, yielded the bestfit, thus indicating that strain anisotropy is the main source of the departure from a smooth functionof line broadening as a function of 2
observed in all samples. © 2008 International Centre for